Characterising colloidal silica particle interactions using atomic force microscopy

Condensed Matter lunchtime seminar

Characterising colloidal silica particle interactions using atomic force microscopy

  • Event time: 1:00pm until 2:00pm
  • Event date: 22nd October 2018
  • Speaker: Joseph French
  • Location: Room 2511,

Event details

In this talk I will be investigating the forces observed between silica colloids using atomic force microscopy. This is done by using a quantitative analysis of force curves generated from interacting a silica tip with a borosilica surface. From the curves it is observed that as the ionic strength increases the repulsive forces and screening length in turn decrease, eventually yielding to the attractive van der Waals forces between the two surfaces at high ionic strengths. This transitional region between the repulsive and attractive forces at contact is characterised using the atomic force microscope and discussed in a rheological context.

About Condensed Matter lunchtime seminars

This is a weekly series of informal talks given primarily by members of the soft condensed matter and statistical mechanics groups, but is also open to members of other groups and external visitors. The aim of the series is to promote discussion and learning of various topics at a level suitable to the broad background of the group. Everyone is welcome to attend..

Find out more about Condensed Matter lunchtime seminars.